The new energy vehicles are driving rapid growth in automotive electronics demand. Comparing to the traditional cars , new energy vehicles require more analog ICs because of the increasing features from motorization and intelligence ,e.g., electrification, smart cockpit, telematics, ADAS, infotainment and lighting.
The vehicles require higher reliability standard analog ICs. In order to comply with that, Runic technology is collaborating with wafer foundries that areI ATF16949 certified with mature AEC-Q100 process, as well as industry leading assembly factories, such as ASEN Semiconductors Co, etc., in order to develop automotive grade products that meet AEC-Q100 and MSD1. In addition, Runic is also adopting ISO26262 ASILD safety standard system under the guidance of TüV Rheinland.
| Product category | Product | Package | Wafer output | Package design & material preparation | Package design of experiment | Seal test trial production |
| Operational amplifier | RS722PXK-Q1 | SOP8 | Done | Done | Done | Done |
| RS724XP-Q1 | SOP14 | Done | Done | Done | Done | |
| RS8414PXQ-Q1 | TSSOP14 | Done | Done | Done | Done | |
| RS8452XK-Q1 | SOP8 | Done | Done | Done | Done | |
| RS8454XP-Q1 | SOP14 | Done | Done | Done | Done | |
| RS8454PXQ-Q1 | TSSOP14 | Done | Done | NA | TBD | |
| RS622XQ-Q1 | TSSOP8 | Done | Done | TBD | ||
| RS8412PXK-Q1 | SOP8 | TBD | ||||
| RS721PXF-Q1 | SOT23-5 | Done | Done | Done | Done | |
| RS8557XF-Q1 | SOT23-5 | Done | Done | Done | ||
| RS8411XF-Q1 | SOT23-5 | Done | Done | On going |
| Comparator | LM2901XQ-Q1 | TSSOP-14 | Done | Done | Done | Done |
| LM2903XK-Q1 | SOP8 | Done | Done | Done | Done | |
| RS393XK-Q1 | SOP8 | Done | Done | Done | Done | |
| RS331XF-Q1 | SOT23-5 | Done | Done | On going | ||
| RS8907XF-Q1 | SOT23-5 | Done | Done | On going |
| Analog switch | RS2251XTSS16-Q1 | TSSOP16 | Done | Done | Done | Done |
| Level converter | RS2T45XVS8-Q1 | VSSOP8 | Done | Done | Done | Done |
| RS8T245YTSS24-Q1 | TSSOP24 | Done | Done | Done | Done | |
| RS4T245XTQW16-Q1 | DHVQFN 16 | Done | Done | Done | Done | |
| RS1T45XC6-Q1 | SOT363 | Done | Done | Done | Done | |
| RS1T34XF5-Q1 | SOT23-5 | Done | Done | |||
| RS8T245YS24-Q1 | SOP24 | NA |
| Logic IC | RS244YTSS20-Q1 | TSSOP20 | Done | Done | Done | Done |
| RS1G32XF5-Q1 | SOT23-5 | Done | Done | Done | Done | |
| RS1G08XC5-Q1 | SC70-5 | Done | Done | Done | Done | |
| RS1G14XC5-Q1 | SC70-5 | Done | Done | Done | ||
| RS1G17XC5-Q1 | SC70-5 | Done | Done | Done | ||
| RS1G00XC5 | SC70-5 | Done | TBD | |||
| RS1G14XF5-Q1 | SOT23-5 | Done | Done |
| Voltage reference | RS431AXSF3-Q1 | SOT23 | On going |
| developing... |
AEC-Q100 is a failure mechanism based stress test qualification for packaged integrated circuits used in automotive applications. This specification has been established by the Automotive Electronics Council (AEC) to define part-qualification and quality-system standards for packaged integrated circuits used in the automotive industry. In order to ensure proper function in harsh environment, electronics used in automotive industry has to meet higher quality and reliability standard that is defined in AEC-Q100.
| NO | TEST ITEM | ABBREVIATION. | TEST METHODOLOGY |
| GROUP A Accelerated Environmental Stress Tests | |||
| A1 | Pre-conditioning | PC |
J-STD-020 JESD22-A113 |
| A2 | temperature/humidity/bias / highly accelerated stress test | THB/HAST |
JESD22-A01 JESD22-A110 |
| A3 | autoclave / unbiased HAST / temperature humidity | AC/UHST/TH |
JESD22-A102 JESD22-A118 JESD22-A101 |
| A4 | temperature cycling | TC | JESD22-A104 |
| A5 | High temperature storage life | HTSL | JESD22-A103 |
| GROUP B Accelerated Lifetime Simulation Tests | |||
| B1 | high temperature operating life | HTOL | JEDEC JESD22-A108 |
| B2 | early life failure rate | ELFR | AEC-Q100-008 |
| GROUP C Package Assembly Integrity Tests | |||
| C1 | wire bond shear | WBS | AEC-Q100-001 |
| C2 | wire bond pull | WBP | MIL - STD 883 Method2011 |
| C3 | solderability MCM external leads | SD | JESD22-B102 |
| C4 | physical dimensions | PD |
JESD22-B100 JESD22-B108 |
| C5 | solder ball shear | SBS | AEC-Q100-010 |
| C6 | lead integrity | LI | JESD22-B105 |
| GROUP D Die Fabrication Reliability Tests | |||
| D1 | electromigration | EM | / |
| D2 | time dependent dielectric breakdown | TDDB | / |
| D3 | hot carrier injection | HCI | / |
| D4 | negative bias temperature instability | NBTI | / |
| D5 | stress migration | SM | / |
| GROUP E Electrical Verification Tests | |||
| E1 | pre-and post-stress function/parameter | TEST | 規(guī)格書 |
| E2 | electrostatic discharge human body model | HBM | AEC-Q100-002 |
| E3 | electrostatic discharge charged device model | CDM | AEC-Q100-011 |
| E4 | latch-up | LU | AEC-Q100-004 |
| E5 | electrical distribution | ED | AEC-Q100-009 |
| E6 | fault grading | FG | AEC-Q100-007 |
| E7 | characterization | CHAR | AEC-Q003 |
| E8 | electromagnetic compatibility | EMC | SAE JI752/3 |
| GROUP F Defect Screening Tests | |||
| F1 | part averaging testing | PAT | AEC-Q001 |
| F2 | statistical bin/yield analysis | SBA | AEC-Q002 |
Highest standard TSK tri-temperature prober and industry leading Cohu tester are used to implement Runic's tri-temperature test.
Runic implements low temperature test to screen wafer level early defects and room/high temperature tests for finished goods. All automotive grade products at Runic will go through full tri-temperature test flow.
| Motor Cotrol |
| Low offset Op-amp |
| RS721P / RS722P / RS724P |
| General-purpose Op-amp |
| RS321 / RS358 / RS324 / LM358 |
| High Voltage general Op-amp |
| RS8411 / RS8412 / RS8414 |
| High Voltage Comparator |
| LM393 / LM331 / LM2903 / LM2901 |
| Shunt Voltage Reference |
| RS431 / RS432 |
| Level Converter |
| RS2T45 / RS8T245 |
| Small Logic |
| RS4G00 / RS1G08 / RS2G08 / RS4G08 / RS1G17 / RS1G125 |
| Intelligent cockpit |
| High-precision LDO |
| RS3236 |
| High Voltage LDO |
| RS73xx-1 / RS3007 |
| Level Converter |
| RS010X / RS2T45 / RS4T245 |
| Analog Switch |
| RS2227 / RS2228 |
| Load Switch |
| RS2588 |
| Low Noise Operational Amplifier |
| RS62X |
| GPS Tracker |
| Low-power comparators |
| RS8901 |
| High-precision LDO |
| RS3221 / RS3236 |
| High-precision Op-amp |
| RS8511 |
| Mobile wireless charging |
| High Voltage LDO |
| RS73xx-1 |
| General-purpose Op-amp |
| LM358 |
| Driving recorder |
| High-precision LDO |
| RS3236 |
| High Voltage LDO |
| RS73xx-1 / RS3007 |
| Level Converter |
| RS010X / RS2T45 / RS4T245 |
| Analog Switch |
| RS2227 / RS2228 |
| Load Switch |
| RS2588 |
| Low Noise Operational Amplifier |
| RS62X |
| Door module |
| Low Noise Operational Amplifier |
| RS721 / RS722 |
| General-purpose Op-amp |
| RS358A / LM358 |
| High Voltage general Op-amp |
| RS8412 / RS8422 |
| High-speed Comparator |
| RS331 |
| High Voltage Comparator |
| LM2903 |
| BCM |
| Low Noise Operational Amplifier |
| RS722 |
| General-purpose Op-amp |
| RS321 / RS324 / RS358A / RS6331 / RS6334 / LM358 |
| High Voltage general Op-amp |
| RS841X / RS842X |
| High-speed Comparator |
| RS331 |
| High Voltage Comparator |
| LM2901 / LM2903 |
| Shunt Voltage Reference |
| RS31XX |
| Analog Switcg |
| RS2057 / RS225X |
| Level Converter |
| RS2T45 / RS0204 / RS0108 |
| Small Logic |
| RS1G17 / RS1G125 / RS4G125 / RS1G126 / RS1G07 |
| Low Noise Operational Amplifier |
| RS72x |
| High Voltage General-purpose Op-amp |
| RS842x / RS845xP / RS841x |
| High Voltage General-purpose Op-amp |
| RS865x |
| High Voltage Comparator |
| LM2903 / LM2901 |
| Level Converter |
| RS010x / RS020x / RSxT245 / RSxT45 |
| Analog Switch |
| RS2251 / RS2252 / RS2257 / RS2102 |
| Voltage Reference |
| RS431 / RS432 |
| Reset |
| RS809 / RS706 |
| Logic IC |
| RS1G14 / RS6G14 / RS6G07 / RS4G08 / RS245 |
Runic Technology is continuously pursuing higher quality management systems. We have established DQE, SQE, CQE, QS to improve quality management on design, manufacture and test, which will result in higher product quality.
